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IC Chemical Processing
IC Failure Analysis
FIB Application
ESD/Latch-up Test
 
 
   聚焦离子束应用 →
微线路修改
Probing Pad Building
Cross section
 
FIB Application Range A
微线路修改(Microcircuit Modification)
可直接对金属线做切断、连接或跳线处理.相对于再次流片验证,先用FIB工具来验证线路设计的修改,在时效和成本上具 有非常明显的优势.
 
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